发明名称 Patterned plasma treatment to improve distribution of underfill material
摘要 A patterned plasma treatment may be provided on the chip and/or the substrate to enhance the distribution of underfill material between the chip and the substrate. The underfill material is typically dispensed after the chip is electrically connected to the substrate. The chip may be electrically connected to the substrate by an array of solder bumps, as one example. The underfill material is draw into a gap between the chip and the substrate by a capillary action. The patterned plasma-treated area formed on the chip and/or on the substrate may cause greater capillary force on the underfill material, as compared to non-plasma-treated areas. Such patterned plasma-treatment area may be designed and laid out to provide for more or better control of the underfill distribution between the chip and substrate while forming a chip package.
申请公布号 US2005127533(A1) 申请公布日期 2005.06.16
申请号 US20030732567 申请日期 2003.12.10
申请人 ODEGARD CHARLES A.;YUNUS MOHAMMAD;ARABE FERDINAND B. 发明人 ODEGARD CHARLES A.;YUNUS MOHAMMAD;ARABE FERDINAND B.
分类号 H01L21/56;H01L23/22;(IPC1-7):H01L23/22 主分类号 H01L21/56
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