发明名称 FLATNESS MEASURING DEVICE OF WORKPIECE EQUIPPED WITH WORKPIECE PEDESTAL, AND THE WORKPIECE PEDESTAL
摘要 PROBLEM TO BE SOLVED: To provide a workpiece pedestal to inhibit generation of ESD and adhesion of dust, by making a contact area small and maintaining a stable support status on the workpiece. SOLUTION: In the case of a flatness test, a central convex part 22 of a flat column-shaped pedestal body 21 is fixed on a hole part Wa of an annular shape workpiece W. Then, on the work-piece pedestal which supports horizontally at the inner circumference of the work-piece W from downward by an annular face 21a which encloses the central convex part 22, the fine projections 24A(64A)(74A) with their edges having the sharp points are allotted and formed to all regions equally at the annular face 21a in the pedestal body 21, the tops 24a(64a)(74a) of the fine projections 24A(64A)(74A) are set as a workpiece support face. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005156551(A) 申请公布日期 2005.06.16
申请号 JP20040322658 申请日期 2004.11.05
申请人 SHOWA DENKO KK 发明人 OINUMA KEIICHI
分类号 G01B21/00;G01B21/30;(IPC1-7):G01B21/00 主分类号 G01B21/00
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