发明名称 ECCENTRICITY MEASUREMENT METHOD AND DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an eccentricity measurement method capable of highly precisely measuring an aspheric eccentricity amount and an aspheric eccentricity direction of an aspheric lens even when an inclination of an aspheric axis is small in the aspheric surface. SOLUTION: A first area including an efficient diameter and a second area arranged in the outer circumferential part of the first area and provided with a larger aspheric amount than the first area are defined, and eccentricity of the aspheric lens is measured when the surface shape of the second area is measured. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005156469(A) 申请公布日期 2005.06.16
申请号 JP20030398173 申请日期 2003.11.27
申请人 OLYMPUS CORP 发明人 NAGAYAMA TSUTOMU
分类号 G01B11/27;G01B21/24;G01M11/00;(IPC1-7):G01B21/24 主分类号 G01B11/27
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