发明名称 One hundred millimeter high purity semi-insulating single crystal silicon carbide wafer
摘要 A single polytype single crystal silicon carbide wafer is disclosed having a diameter greater than three inches and less than five inches, resistivity greater than 10,000 ohm-cm, a micropipe density less than 200 cm<SUP>-2</SUP>, and a combined concentration of shallow level dopants less than 5E16 cm<SUP>-3</SUP>.
申请公布号 US2005126471(A1) 申请公布日期 2005.06.16
申请号 US20040876963 申请日期 2004.06.25
申请人 JENNY JASON R.;MALTA DAVID P.;HOBGOOD HUDSON M.;MUELLER STEPHAN G.;BRADY MARK;LEONARD ROBERT T.;POWELL ADRIAN;TSVETKOV VALERI F. 发明人 JENNY JASON R.;MALTA DAVID P.;HOBGOOD HUDSON M.;MUELLER STEPHAN G.;BRADY MARK;LEONARD ROBERT T.;POWELL ADRIAN;TSVETKOV VALERI F.
分类号 H01L21/205;C30B23/00;C30B29/36;C30B33/00;H01L21/324;(IPC1-7):C30B23/00;C30B25/00;C30B28/12;C30B28/14 主分类号 H01L21/205
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