发明名称 HOLDER FOR INSPECTION APPARATUS
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a holder for an inspection apparatus, in which an object for inspection such as a glass substrate, a mask blank and a photomask is mounted, by using a general-purpose handling tool and the object in a mounted state can be inspected for transmitted light up to its peripheral portion. <P>SOLUTION: The holder 100 for an inspection apparatus has a fixing member 40 composed of a support member 21 and a positioning member 31 disposed at a prescribed positions on a planar support base 11. The support base 11 comprises a transparent glass substrate, a plastic plate or the like. The fixing member 40 positions the object of inspection in X and Y directions and holds the object, and the upper face of the positioning member 31 of the fixing member 40 is tapered and is made of a material having high elasticity. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>
申请公布号 JP2005156924(A) 申请公布日期 2005.06.16
申请号 JP20030395057 申请日期 2003.11.26
申请人 TOPPAN PRINTING CO LTD 发明人 YOSHIDA HIROKAZU
分类号 G03F1/66;G03F1/84;H01L21/027;(IPC1-7):G03F1/14;G03F1/16;G03F1/08 主分类号 G03F1/66
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