发明名称 METHOD AND APPARATUS FOR EVALUATING POLLUTION, EXPOSURE METHOD AND EXPOSURE SYSTEM
摘要 PROBLEM TO BE SOLVED: To accurately measure the amount of pollutants deposited in a treatment chamber by energy beam irradiation. SOLUTION: The treatment chamber is filled with atmosphere, containing a predetermined substance and a quartz vibrator, is irradiated with the energy beam in this atmosphere containing the predetermined substance to bond the pollutant to the quartz vibrator. The resonance frequency of the quartz vibrator is measured, in parallel with the irradiation with the energy beam. By using the phenomenon that the resonance frequency of the quartz vibrator lowers with the increase in weight, a chanze in the weight of the quartz vibrator is calculated from the change in the resonance frequency of the quartz vibrator, to measure the amount of the pollutant bonded on the quartz vibrator. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005156191(A) 申请公布日期 2005.06.16
申请号 JP20030391270 申请日期 2003.11.20
申请人 SEMICONDUCTOR LEADING EDGE TECHNOLOGIES INC 发明人 ISHIKAWA SEIICHI
分类号 G01N1/22;G01N5/02;G03F7/20;H01L21/027;(IPC1-7):G01N5/02 主分类号 G01N1/22
代理机构 代理人
主权项
地址