发明名称 |
MICRO-MECHANICAL SEMICONDUCTOR ACCELEROMETER |
摘要 |
A precision, micro-mechanical semiconductor accelerometer of the differential-capacitor type comprises a pair of etched opposing cover layers fusion bonded to opposite sides of an etched proofmass layer to form a hermetically sealed assembly. The cover layers are formed from commercially available, Silicon-On-Insulator ("SOI") wafers to significantly reduce cost and complexity of fabrication and assembly. The functional semiconductor parts of the accelerometer are dry-etched using the BOSCH method of reactive ion etching ("RIE"), thereby significantly reducing contamination inherent in prior art wet-etching processes, and resulting in features advantageously bounded by substantially vertical sidewalls. |
申请公布号 |
EP1019733(B1) |
申请公布日期 |
2005.06.15 |
申请号 |
EP19990937439 |
申请日期 |
1999.07.22 |
申请人 |
LITTON SYSTEMS, INC. |
发明人 |
STEWART, ROBERT, E.;GOLDMAN, ARNOLD, E. |
分类号 |
G01P15/125;G01P15/08;H01L29/84 |
主分类号 |
G01P15/125 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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