发明名称 |
IMPROVED METHOD OF CHEMICAL IONIZATION MASS SPECTROMETRY |
摘要 |
A method of detecting a substance present in a gas or a gas mixture using SIFT-MS technology comprising the steps of inducing a supply of alkoxymethyl cations into the inlet of the flow tube, reacting a sample of the as with the alkoxymethyl cations, analysing the reacted gas sample, and calculating the concentration of trace levels of molecules containing heteroatoms in the reacted gas sample. |
申请公布号 |
EP1540696(A1) |
申请公布日期 |
2005.06.15 |
申请号 |
EP20030741689 |
申请日期 |
2003.07.08 |
申请人 |
SYFT TECHNOLOGIES LIMITED |
发明人 |
MCEWAN, MURRAYJAMES;WILSON, PAUL FRANCIS |
分类号 |
H01J49/04;(IPC1-7):H01J49/00 |
主分类号 |
H01J49/04 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|