发明名称 IMPROVED METHOD OF CHEMICAL IONIZATION MASS SPECTROMETRY
摘要 A method of detecting a substance present in a gas or a gas mixture using SIFT-MS technology comprising the steps of inducing a supply of alkoxymethyl cations into the inlet of the flow tube, reacting a sample of the as with the alkoxymethyl cations, analysing the reacted gas sample, and calculating the concentration of trace levels of molecules containing heteroatoms in the reacted gas sample.
申请公布号 EP1540696(A1) 申请公布日期 2005.06.15
申请号 EP20030741689 申请日期 2003.07.08
申请人 SYFT TECHNOLOGIES LIMITED 发明人 MCEWAN, MURRAYJAMES;WILSON, PAUL FRANCIS
分类号 H01J49/04;(IPC1-7):H01J49/00 主分类号 H01J49/04
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