发明名称 COMPOSITION FOR ANTIREFLECTION FILM FORMATION
摘要 <p>There is provided a composition for forming anti-reflective coating containing a urea compound substituted by hydroxyalkyl group or alkoxyalkyl group, and preferably a light absorbing compound and/or a light absorbing resin; a method of forming a anti-reflective coating for a semiconductor device by use of the composition; and a process for manufacturing a semiconductor device by use of the composition. The composition according to the present invention exhibits a good light-absorption to a light having a wavelength used for manufacturing a semiconductor device. Therefore, the composition exerts a high protection effect against light reflection, and has a high dry etching rate compared with photoresist layers.</p>
申请公布号 EP1542075(A1) 申请公布日期 2005.06.15
申请号 EP20030741346 申请日期 2003.07.11
申请人 NISSAN CHEMICAL INDUSTRIES, LTD. 发明人 KISHIOKA, TAKAHIRO;ARASE, SHINYA;MIZUSAWA, KEN-ICHI;NAKAYAMA, KEISUKE
分类号 G03F7/11;C08K5/00;C08L61/24;C08L101/00;G03F7/09;H01L21/027;(IPC1-7):G03F7/11 主分类号 G03F7/11
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