发明名称 Method and apparatus for interconnect built-in self test based system management performance tuning
摘要 A method and apparatus for Interconnect Built-In Self-Test (IBIST) Based System Management Performance Tuning provides for measuring operating conditions of an interconnect, which is between a first device and a second device in a post-production system, at operating speed with a set of one or more test data and a first set of one or more operating parameters. Results of the measuring are stored and operating conditions of the interconnect with the set of test data and a second set of operating parameters are measured. The method and apparatus further provides for selecting either the first or second set of operating parameters based on the measuring of operating conditions to optimize operation of the post-production system.
申请公布号 US6907377(B2) 申请公布日期 2005.06.14
申请号 US20030404476 申请日期 2003.03.31
申请人 INTEL CORPORATION 发明人 SLAIGHT THOMAS M.;NEJEDIO JAY J.;CARR RUSSELL L.
分类号 G06F19/00;(IPC1-7):G06F19/00 主分类号 G06F19/00
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