发明名称 Eddy current inspection method
摘要 A specimen is mounted in a multiaxis machine. An eddy current probe is also mounted in the machine for multiaxis movement relative to the specimen. The probe is aligned in situ with a target in the specimen by direct contact therebetween at multiple alignment sites corresponding with a numerical model of the specimen. Eddy current inspection of the target may then be conducted by moving the probe along multiple inspection sites of the target corresponding with the specimen model.
申请公布号 US6907358(B2) 申请公布日期 2005.06.14
申请号 US20030355810 申请日期 2003.01.30
申请人 GENERAL ELECTRIC COMPANY 发明人 SUH UI WON;SNEED, JR. CLIFFORD
分类号 G01B7/28;G01N27/90;(IPC1-7):G06F19/00 主分类号 G01B7/28
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