发明名称 |
Fabrication of nano-scale temperature sensors and heaters |
摘要 |
The method for the fabrication of nano scale temperature sensors and nano scale heaters using focused ion beam (FIB) techniques. The process used to deposit metal nano strips to form a sensor is ion beam assisted chemical vapor deposition (CVD). The FIB Ga<SUP>+</SUP> ion beam can be used to decompose W(CO)<SUB>6 </SUB>molecules to deposit a tungsten nano-strip on a suitable substrate. The same substrate can also be used for Pt nano-strip deposition. The precursors for the Pt can be trimethyl platinum (CH<SUB>3</SUB>)<SUB>3</SUB>Pt in the present case. Because of the Ga<SUP>+</SUP> beam used in the deposition, both Pt and W nano-strips can contain a certain percentage of Ga impurities, which we denoted as Pt(Ga) and W(Ga) respectively. Our characterization of the response of this Pt(Ga)/W(Ga) nano scale junction indicates it has a temperature coefficient of approximately 5.4 mV/° C. This is a factor of approximately 130 larger than the conventional K-type thermocouples.
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申请公布号 |
US6905736(B1) |
申请公布日期 |
2005.06.14 |
申请号 |
US20020084688 |
申请日期 |
2002.02.27 |
申请人 |
UNIVERSITY OF CENTRAL FLORIDA |
发明人 |
CHOW LEE;ZHOU DAN;STEVIE FRED |
分类号 |
B05D5/12;C23C14/14;C23C14/16;C23C16/04;C23C16/16;C23C16/48;G01K7/02;(IPC1-7):B05D5/12 |
主分类号 |
B05D5/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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