发明名称 |
Method for processing a surface of an SiC semiconductor layer and Schottky contact |
摘要 |
A method for treating a surface on an SiC semiconductor body produced by epitaxy. According to the method, the parts of the epitactic layer that are deposited in the final phase of the epitaxy are removed by etching and a wet chemical treatment is then carried out in order to remove a thin natural oxide on the surface. Alternatively, a metal layer configured as a Schottky contact and/or as an ohmic contact can also be applied to the surface immediately after the removal process.
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申请公布号 |
US6905916(B2) |
申请公布日期 |
2005.06.14 |
申请号 |
US20020146585 |
申请日期 |
2002.05.15 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
BARTSCH WOLFGANG;TREU MICHAEL;RUPP ROLAND |
分类号 |
H01L29/872;H01L21/04;H01L21/20;H01L21/3065;H01L29/47;(IPC1-7):H01L29/74 |
主分类号 |
H01L29/872 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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