发明名称 TEMPERATURE-MEASURING APPARATUS, CHUCK MONITOR, AND PLASMA PROCESSING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a temperature-measuring apparatus having a simple structure, capable of performing temperature measurement with high precision, without being influenced by electromagnetic waves which becomes disturbances. SOLUTION: This temperature measuring apparatus is provided with an infrared-type temperature measurement unit 6 for measuring the temperature of a board 10 in a predetermined processing tank. Between the board 10 and the measurement unit 6, a shielding section 8, made of a material which shuts infrared radiation off and constituted so as to be capable of touching the board 10 is provided, and the device is formed so as to measure the temperature of the shielding section 8 by the measurement unit 6. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005147976(A) 申请公布日期 2005.06.09
申请号 JP20030388854 申请日期 2003.11.19
申请人 ULVAC JAPAN LTD 发明人 FUJII YOSHIJI
分类号 G01K1/14;C23C14/54;G01J5/00;G01J5/02;G01K7/02;G01K11/20;(IPC1-7):G01K1/14 主分类号 G01K1/14
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