发明名称 Fuse circuit with controlled fuse burn out and method thereof
摘要 A fuse arrangement in a semiconductor device, including a fuse resistor being connected to a first voltage, and a transistor passing current to the fuse resistor, wherein a second voltage is applied to a gate of the transistor, the second voltage being greater than the first voltage. Another fuse arrangement in a semiconductor device, including a first fuse resistor having a first terminal connected to a first voltage and a second terminal connected to a first node, a second fuse resistor having a third terminal connected to the first voltage and a fourth terminal connected to a second node, and a transistor being controlled by a first signal with a second voltage, the transistor passing current to the second terminal of the first fuse resistor based on the first signal, the second voltage being greater than the first voltage. A method of burning out a fuse resistor in a fuse arrangement, including converting a received first signal with a first voltage level to a second signal with a second voltage level, the second voltage level being greater than the first voltage level, and applying the second signal to the fuse resistor.
申请公布号 US2005122159(A1) 申请公布日期 2005.06.09
申请号 US20040968171 申请日期 2004.10.20
申请人 KIM JONG-HOON;KANG SANG-SEOK 发明人 KIM JONG-HOON;KANG SANG-SEOK
分类号 G11C7/00;G11C17/18;G11C29/00;(IPC1-7):G11C7/00 主分类号 G11C7/00
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