发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To improve both off-state and on-state breakdown voltages of a horizontal field effect transistor. SOLUTION: The semiconductor device has such a structure that the source region of a second conductivity type, the body region of a first conductivity type, the drain offset region of the second conductivity type, and the drain region of the second conductivity type are formed in order in the surface of a semiconductor substrate. The surface of the body region is coated with a gate insulation film, and a gate electrode is formed on the surface of the gate insulation film. The dopant concentration of the drain offset region is higher on the drain region side than on the body region side. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005150300(A) 申请公布日期 2005.06.09
申请号 JP20030383854 申请日期 2003.11.13
申请人 TOYOTA CENTRAL RES & DEV LAB INC;TOYOTA MOTOR CORP 发明人 HAYAKAWA KIYOHARU;ISHIKO MASAYASU;TAKI MASAHITO;TOSHIMA HIDEKI;ISHIMABUSE HISASHI;KAWAI FUMIAKI
分类号 H01L21/265;H01L29/78;(IPC1-7):H01L29/78 主分类号 H01L21/265
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