发明名称 Measurement system of three-dimensional shape of transparent thin film using acousto-optic tunable filter
摘要 A system for measuring the three-dimensional shape of a transparent thin film using an acousto-optic tunable filter. The system can independently obtain thickness information and shape information about a measurement object having a patterned structure through independent measurements by modes according to whether a blocking plate selectively blocks white light irradiated on a reference mirror plane or not. According to the system for measuring the three-dimensional shape of a transparent thin film using an acousto-optic tunable filter of the present invention, thickness information and shape information about a measurement object including a thin film can be independently measured in two different measurement modes according to whether the blocking plate blocks white light or not, so that three-dimensional shape information of the measurement object can be obtained rapidly.
申请公布号 US2005122529(A1) 申请公布日期 2005.06.09
申请号 US20030729723 申请日期 2003.12.05
申请人 KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY 发明人 KIM SOO H.;KIM DAE S.;KONG HONG J.;YOU JANG W.
分类号 G01B11/24;(IPC1-7):G01B9/02 主分类号 G01B11/24
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