发明名称 |
Measurement system of three-dimensional shape of transparent thin film using acousto-optic tunable filter |
摘要 |
A system for measuring the three-dimensional shape of a transparent thin film using an acousto-optic tunable filter. The system can independently obtain thickness information and shape information about a measurement object having a patterned structure through independent measurements by modes according to whether a blocking plate selectively blocks white light irradiated on a reference mirror plane or not. According to the system for measuring the three-dimensional shape of a transparent thin film using an acousto-optic tunable filter of the present invention, thickness information and shape information about a measurement object including a thin film can be independently measured in two different measurement modes according to whether the blocking plate blocks white light or not, so that three-dimensional shape information of the measurement object can be obtained rapidly.
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申请公布号 |
US2005122529(A1) |
申请公布日期 |
2005.06.09 |
申请号 |
US20030729723 |
申请日期 |
2003.12.05 |
申请人 |
KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY |
发明人 |
KIM SOO H.;KIM DAE S.;KONG HONG J.;YOU JANG W. |
分类号 |
G01B11/24;(IPC1-7):G01B9/02 |
主分类号 |
G01B11/24 |
代理机构 |
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主权项 |
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地址 |
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