| 摘要 |
PROBLEM TO BE SOLVED: To provide an IC tester capable of outputting free with low jitters, while suppressing the scale of a circuit. SOLUTION: An IC tester which tests an object to be tested is improved. The device comprises a first digital signal generating part for generating digital signals, a second digital signal generating part for generating digital signals, a phase-locked loop, in which the digital signal of the second digital signal generating part is inputted; and a flip-flop which re-times the digital signal of the first digital signal generating part with the output of the phase-locked loop, which is supplied to the object to be tested. By adjusting the output of the digital signal generating part, arbitrary outputting can be performed. COPYRIGHT: (C)2005,JPO&NCIPI
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