发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To prevent a deterioration in display quality of a display device in a semiconductor device made by a connection to the display device by a COG packaging with the use of bumps formed on a transistor. SOLUTION: Bumps are formed only on a plurality of transistors composing a driving circuit and having the indentical type and size of a semiconductor device not to cause a difference in characteristic variations of transistors caused by a residual stress between adjacent output terminals, which causes no variation in output signal by the residual stress, being able to prevent the deterioration in display quality of the display device. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005150559(A) 申请公布日期 2005.06.09
申请号 JP20030388615 申请日期 2003.11.19
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 NAGAO KOICHI;INOUE KAZUNORI
分类号 H01L21/60;(IPC1-7):H01L21/60 主分类号 H01L21/60
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