发明名称 EVAPORATION RATE MEASURING METHOD, EVAPORATION CHARACTERISTIC MEASURING METHOD, AND EVAPORATION CHARACTERISTIC MEASURING INSTRUMENT
摘要 PROBLEM TO BE SOLVED: To provide an evaporation rate measuring method and an evaporation characteristic measuring method capable of measuring quantitatively and quickly an evaporation rate or the like of a liquid. SOLUTION: A liquid material is delivered in a form of a micro liquid drop by an ink jet device 10, and the evaporation rate of the liquid material is measured based on a mass of the liquid drop and a drying time thereof. The drying time of the liquid drop is detected based on an image picked up by a high speed camera 3, and the mass of the liquid drop is estimated based on a shape or the like just after the delivery. The drying time may be measured by direct observation of the liquid drop using a microscope. The mass may be measured directly using a quartz oscillator or the like. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005147829(A) 申请公布日期 2005.06.09
申请号 JP20030385126 申请日期 2003.11.14
申请人 SEIKO EPSON CORP 发明人 MASUDA TAKASHI
分类号 G01B11/08;G01N5/04;G01N13/00;(IPC1-7):G01N5/04 主分类号 G01B11/08
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