发明名称 THREE-DIMENSIONAL COORDINATES MEASURING PROBE AND THREE-DIMENSIONAL COORDINATES MEASURING SYSTEM USING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a probe proper for measuring continuous line such as ridgeline and a three-dimensional coordinates measuring system using the probe. SOLUTION: A spherical probe body 10 is notched with two semicircles notching planes crossing with an angleθ(=120 degrees) on a center line passing the center G of the sphere 14 as a cross line to make nearly 2/3 of a sphere. Positions separating each notching planes of the two semicircles are made reference ridgelines 11a and 11b, which are made inclined planes 12a to 12d declining toward the direction parting from the reference ridgelines 11a and 11b. The probe body 10 is rotatable around the axis 9 and so measurement is made by manually moving the probe along the cross point of the reference ridgelines 11a and 11b attaching the edge of the outline of a panel part. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005147673(A) 申请公布日期 2005.06.09
申请号 JP20030380643 申请日期 2003.11.11
申请人 NISSAN MOTOR CO LTD 发明人 OZAWA ISAO;KAWAWA KIYOBUMI
分类号 G01B5/20;G01B5/012;G01B21/00;(IPC1-7):G01B21/00 主分类号 G01B5/20
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