发明名称 |
Electropolishing apparatus, electropolishing method, and method of manufacturing semiconductor device |
摘要 |
The formation of a groove wiring or a via contact which causes no retreat of a metal section by overpolishing by removing a section carrying little current which locally rises in a wafer face with the progress of electropolishing. In an electropolishing apparatus comprising a counter electrode ( 11 ) at a position facing a workpiece substrate ( 51 ), the counter electrode ( 11 ) consists of concentrically disposed electrodes ( 11 a- 11 e). Each of the electrodes ( 11 a- 11 e) has a power supply source ( 13 ) controlled independently and comprises a detector (unillustrated) for detecting a change in the current and voltage between each of the electrodes ( 11 a- 11 e) and the workpiece substrate ( 51 ) and a controller ( 15 ) for controlling a power supply to the electrodes ( 11 a- 11 e) on the basis of a change in the current and voltage detected by this detector.
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申请公布号 |
US2005121335(A1) |
申请公布日期 |
2005.06.09 |
申请号 |
US20040508510 |
申请日期 |
2004.09.21 |
申请人 |
SONY CORPORATION |
发明人 |
NOGAMI TAKESHI;KOMAI NAOKI |
分类号 |
C25F7/00;H01L21/3063;H01L21/321;H01L21/768;(IPC1-7):B23H5/00 |
主分类号 |
C25F7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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