发明名称 METHOD OF ANALYZING TRACE COMPONENT
摘要 <p>A method of analyzing a trace component, in which the preparation of a sample for analyzing a trace component of a material can be accomplished by one short-time extraction operation without conducting long-time extraction operation to thereby realize rapid analysis of trace components of materials. In particular, the method of analyzing a trace component comprises the step of disposing on a sample stage a sample piece of a material to be analyzed; the step of dropping on the sample stage a solvent capable of extracting a component from the sample piece so as to incorporate the solvent in the clearance between the sample stage and the sample piece disposed on the sample stage; the step of retaining at room temperature the solvent incorporated in the clearance between the sample stage and the sample piece so as to extract a component from the sample piece by means of the solvent retained in the clearance between the sample stage and the sample piece; and the step of analyzing the component having been extracted from the sample piece.</p>
申请公布号 WO2005052551(A1) 申请公布日期 2005.06.09
申请号 WO2003JP15090 申请日期 2003.11.26
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA;NAKA, JIRO;KUROKAWA, HIROSHI;KOBAYASHI, JUNJI;TOYAMA, SATORU;HIRANO, NORIKO;HARA, EIJI 发明人 NAKA, JIRO;KUROKAWA, HIROSHI;KOBAYASHI, JUNJI;TOYAMA, SATORU;HIRANO, NORIKO;HARA, EIJI
分类号 G01N1/40;G01N30/00;(IPC1-7):G01N1/28 主分类号 G01N1/40
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