| 摘要 |
PROBLEM TO BE SOLVED: To realize an IC tester capable of checking input and output contention. SOLUTION: A driver and a comparator are connected to the same pins of an object to be tested to perform input and output; and the driver becomes capable of operating by an enable signal, to provide a signal for the object to be tested. The comparator compares the output of the object to be tested with an expected value by a strobe signal in an IC tester and is improved, to achieve the IC tester. The IC tester is provided with a conflict detecting part for detecting the input and output conflicts, by inputting an enable signal and a strobe signal. COPYRIGHT: (C)2005,JPO&NCIPI
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