发明名称
摘要 It is provided a polishing pad of novel construction capable of controlling actively and efficiently a slurry flow during polishing a surface of a semiconductor substrate, such as a wafer, thus making it possible to precisely and stably performing a desired polishing process. Onto a surface of a pad substrate 12 of synthetic resin material, formed is a groove 16 extending approximately circumferentially. An inner circumferential wall surface 20 and an outer circumferential wall surface 22 are made parallel to each other and slant with respect to a center axis 18 of the pad substrate 12.
申请公布号 JP3658591(B2) 申请公布日期 2005.06.08
申请号 JP20030581244 申请日期 2003.04.01
申请人 发明人
分类号 B24B37/00;B24B37/04;B24B37/20;B24B37/24;B24B37/26;B24D3/28;H01L21/302;H01L21/304;H01L21/461;(IPC1-7):H01L21/304 主分类号 B24B37/00
代理机构 代理人
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