发明名称 Integrated semiconductor memory and method for reducing leakage currents in an integrated semiconductor
摘要 An integrated semiconductor memory can include a plurality of subcircuit blocks arranged on nonoverlapping area sections. The subcircuit blocks each have a block supply line and a block ground line, which supply individual switching elements of the subcircuit blocks with a voltage. Each block supply line and block ground line is connected to a chip supply line and a chip ground line, which run outside the area sections of the subcircuit blocks. At least one connection between the chip supply line and the block supply line of at least one subcircuit block or between the chip ground line and the block ground line of at least one subcircuit block can be isolated by a switching device. Furthermore, a method for reducing leakage currents in a semiconductor memory, which, depending on the operating state of the semiconductor memory, isolates or connects individual subcircuit blocks of the semiconductor memory from or to a voltage supply.
申请公布号 US6903423(B2) 申请公布日期 2005.06.07
申请号 US20040843318 申请日期 2004.05.12
申请人 INFINEON TECHNOLOGIES, AG 发明人 FISCHER HELMUT;EGERER JENS
分类号 G11C5/14;G11C11/407;G11C29/00;G11C29/02;H01L29/76;H01L29/94;H01L31/062;H01L31/113;H01L31/119;(IPC1-7):H01L29/76 主分类号 G11C5/14
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