| 摘要 |
A system is provided for use with an on-chip fuse. If the fuse ( 40 ) is to be blown, the system blows the fuse, then performs a test read by comparing it with a larger-than-normal reference resistance ( 41, 42 ). If, even using the larger-than-normal reference resistance, the fuse reads as blown, then it is possible to be much more confident that the fuse will read correctly when compared against the normal reference resistance ( 42 ), even with aging and with variations of temperature and supply. For future reads during normal operation, the system compares it with the normal reference resistance ( 42 ). If, on the other hand, the fuse does not read as blown during the test read then the device can be rejected as a failed device.
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