发明名称 Oscillating chemical mechanical planarization apparatus
摘要 A chemical mechanical polishing (CMP) apparatus is provided. The CMP apparatus includes a first roller situated at a first point and a second roller situated at a second point. The first point is separate from the second point. Also included in the apparatus is a polishing pad strip having a first end secured to the first roller and a second end secured to the second roller. The first roller and the second roller are configured to reciprocate so that the polishing pad strip oscillates at least partially between the first point and the second point.
申请公布号 US6902466(B2) 申请公布日期 2005.06.07
申请号 US20030369919 申请日期 2003.02.18
申请人 LAM RESEARCH CORPORATION 发明人 SALDANA MIGUEL A.;OWCZARZ ALEKSANDER A.
分类号 B24B7/20;B24B21/00;B24B21/04;B24B37/04;H01L21/304;(IPC1-7):B24B49/00 主分类号 B24B7/20
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