发明名称 Bit line segmenting in random access memories
摘要 An integrated memory circuit and corresponding method for segmenting bit lines are provided, where the integrated memory circuit includes a sense amplifier, a layered bit line in signal communication with the sense amplifier, several segment pass transistors in signal communication with the layered bit line, several segmented bit lines, each in signal communication with a corresponding one of the several segment pass transistors, respectively, several memory cell pass transistors in signal communication with one of the several segmented bit lines, and a plurality of memory cell capacitors, each in signal communication with a corresponding one of the plurality of memory cell transistors, respectively; and where the corresponding method for segmenting bit lines includes receiving a memory cell address, activating a memory cell pass transistor with a wordline corresponding to the memory cell address, receiving a signal indicative of the memory cell charge level on a segmented bit line through the memory cell transistor, activating a segment pass transistor corresponding to the memory cell address, receiving a signal indicative of the memory cell charge level on a layered bit line through the segment pass transistor, and receiving a signal indicative of the memory cell charge level at the sense amplifier through the layered bit line.
申请公布号 US6903982(B2) 申请公布日期 2005.06.07
申请号 US20020269005 申请日期 2002.10.10
申请人 INFINEON TECHNOLOGIES AG 发明人 MA DAVID SUITWAI;CHEN AIQIN
分类号 G11C8/12;G11C11/406;G11C11/4097;(IPC1-7):G11C7/00 主分类号 G11C8/12
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