发明名称 Reducing time to measure constraint parameters of components in an integrated circuit
摘要 Reducing the time required to measure constraint parameters (setup time, hold time and pulse width) of components in integrated circuits. For example, the delay of propagation of a signal between an input node and an intermediate node of a component are measured. An approximate range of possible values is formulated, and a search (by applying signals assuming one of the values in the approximate range and examining the output signal(s)) is conducted within the range to determine the value of the constraint parameters.
申请公布号 US6904579(B2) 申请公布日期 2005.06.07
申请号 US20030403080 申请日期 2003.04.01
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 KATLA SREEKANTHA MADHAVA;PRASAD VIKAS K.;BHOWMIK SURAVI;SHAH KALPESH AMRUTHLAL
分类号 G06F9/45;G06F17/50;(IPC1-7):G06F17/50 主分类号 G06F9/45
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