发明名称 |
Methods and apparatus to minimize debugging and testing time of applications |
摘要 |
Methods and apparatus to minimize debugging and testing time of applications are described herein. In an example method, an instrumented code of the application is generated. A plurality of tests is executed on the instrumented code of the application. One or more test profiles associated with the plurality of tests are generated. A list containing at least one of the plurality of tests based on the one or more test profiles is identified.
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申请公布号 |
US2005120274(A1) |
申请公布日期 |
2005.06.02 |
申请号 |
US20030714033 |
申请日期 |
2003.11.14 |
申请人 |
HAGHIGHAT MOHAMMAD R.;SEHR DAVID C. |
发明人 |
HAGHIGHAT MOHAMMAD R.;SEHR DAVID C. |
分类号 |
G06F11/00;(IPC1-7):G06F11/00 |
主分类号 |
G06F11/00 |
代理机构 |
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地址 |
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