发明名称 COLOR MEASUREMENT PROFILE WITH EMBEDDED CHARACTERIZATION
摘要 A data structure by which a color management system can model color behavior of a color device. More particularly, the data structure includes a measurement component including a collection of measurements, where each measurement represents at least one control signal by which a sample color measurement is obtained by effecting a corresponding color output from or input to the color device, or a set of color coordinates which correlate to the at least one control signal, or both. The data structure also includes a characterization process component which includes platform-independent code for a characterization process by which the collection of measurements is processed to produce a color behavior model for the color device. The invention preferably includes a control parameter component which includes control parameters representing a type or state of the device, where the characterization process component processes the collection of measurements in accordance with the control parameters, in order to generate a color transform corresponding to the type or state of the color device.
申请公布号 WO2005050355(A2) 申请公布日期 2005.06.02
申请号 WO2004US36775 申请日期 2004.11.05
申请人 CANON KABUSHIKI KAISHA;HAIKIN, JOHN, S. 发明人 HAIKIN, JOHN, S.
分类号 G06F;H04N1/60 主分类号 G06F
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