发明名称 SURFACE TREATMENT METHOD OF SILICON SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To carry out both cleaning of a silicon (001) surface and flattening in monoatomic order at a temperature lower that a conventionally known temperature. SOLUTION: A silicon substrate 1 where an oxide film 2 is formed in a (001) surface is treated by a hydrogen fluoride water solution comprising a hydroxide ion reducer (hydrochloric acid, for example) and the oxide film 2 is peeled äFig.(c)}. The silicon substrate is subjected to a heating treatment in a gas comprising hydrogen äFig.(d)}. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005142445(A) 申请公布日期 2005.06.02
申请号 JP20030378992 申请日期 2003.11.07
申请人 NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY 发明人 MORITA YUKINORI;NISHIZAWA MASAYASU
分类号 C30B29/06;C30B33/10;H01L21/304;(IPC1-7):H01L21/304 主分类号 C30B29/06
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