发明名称 |
SURFACE TREATMENT METHOD OF SILICON SUBSTRATE |
摘要 |
PROBLEM TO BE SOLVED: To carry out both cleaning of a silicon (001) surface and flattening in monoatomic order at a temperature lower that a conventionally known temperature. SOLUTION: A silicon substrate 1 where an oxide film 2 is formed in a (001) surface is treated by a hydrogen fluoride water solution comprising a hydroxide ion reducer (hydrochloric acid, for example) and the oxide film 2 is peeled äFig.(c)}. The silicon substrate is subjected to a heating treatment in a gas comprising hydrogen äFig.(d)}. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2005142445(A) |
申请公布日期 |
2005.06.02 |
申请号 |
JP20030378992 |
申请日期 |
2003.11.07 |
申请人 |
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY |
发明人 |
MORITA YUKINORI;NISHIZAWA MASAYASU |
分类号 |
C30B29/06;C30B33/10;H01L21/304;(IPC1-7):H01L21/304 |
主分类号 |
C30B29/06 |
代理机构 |
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