发明名称 CAM CABABLE OF TESTING PRESENCE OF DEFECT OF PRIORITY ENCODER, AND METHOD OF TESTING PRESENCE OF DEFECT OF PRIORITY ENCODER
摘要 PROBLEM TO BE SOLVED: To provide a cam which can test for the presence of defect of a priority encoder, and a method of testing the presence of defect of a priority encoder. SOLUTION: This CAM is provided with a CAM cell array provided with a plurality of CAM cells, a priority encoder, and a shift register unit. The priority encoder tests the CAM cell array, to determine if the CAM cell array has errors by comparing search data with data stored in the CAM cell array. The shift register unit, in response to a clock signal, transmits first through m-th test data to the priority encoder, to test the priority encoder. The logic level of the first through the m-th test data are changed sequentially, in synchronization with the clock signal. If there are no errors in the priority encoder, the priority encoder sequentially outputs word line addresses of the most-significant bit through the least-significant bit of the CAM cell array. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005141901(A) 申请公布日期 2005.06.02
申请号 JP20040319825 申请日期 2004.11.02
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 SHIN HO-GEUN
分类号 G11C15/04;G11C15/00;G11C29/02;G11C29/56;(IPC1-7):G11C29/00 主分类号 G11C15/04
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