发明名称 Method for producing for a mask a mask layout which avoids aberrations
摘要 A method for producing for a mask a mask layout which avoids aberrations in which a provisional auxiliary mask layout produced, in particular in accordance with a prescribed electrical circuit diagram is converted into the mask layout with the aid of an OPC method. At least two different OPC variants are used in the course of the OPC method by subdividing the original auxiliary mask layout into at least two layout areas and processing each of the layout areas in accordance with one of the at least two OPC variants.
申请公布号 US2005120326(A1) 申请公布日期 2005.06.02
申请号 US20040997695 申请日期 2004.11.24
申请人 INFINEON TECHNOLGIES AG 发明人 SEMMLER ARMIN;THIELE JORG;MEYNE CHRISTIAN;BODENDORF CHRISTOF
分类号 G03F1/00;G03F1/14;G06F17/50;(IPC1-7):G06F17/50;G03F9/00 主分类号 G03F1/00
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