Package map data outputting circuit of semiconductor memory device and method for outputting package map data

摘要

The invention relates to a package map data outputting circuit of a semiconductor memory device embedded with a test circuit and a method for the same. In order to improve the reliability of package map data and easily output a greater amount of package map data, package map data is stored to package map data registers at the wafer level and then output through the test circuit at the package level.