发明名称 |
Semiconductor device and method of manufacture |
摘要 |
In a semiconductor manufacturing method, an emitter region ( 211 ) and a base enhancement region ( 207 ) are formed to provide linear voltage, capacitance and low resistance characteristics. In the manufacturing method, a semiconductor device ( 200 ) is formed on a silicon substrate layer ( 101 ) with an epitaxial layer ( 203 ). Trenches ( 233 ) are cut into the epitaxial layer ( 203 ) and filled with oxide ( 601 ) to provide reduced junction capacitance and reduced base resistance. The emitter region ( 211 ) and the base enhancement region ( 207 ) are simultaneously formed through an anneal process.
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申请公布号 |
US6900105(B2) |
申请公布日期 |
2005.05.31 |
申请号 |
US20020211842 |
申请日期 |
2002.08.02 |
申请人 |
FREESCALE SEMICONDUCTOR, INC. |
发明人 |
FREEMAN, JR. JOHN L.;BALDA RAYMOND J.;PRYOR ROBERT A.;PETRUCCI, JR. JOSEPH L.;JOHNSEN ROBERT J. |
分类号 |
H01L21/331;H01L21/762;H01L29/08;H01L29/10;(IPC1-7):H01L21/331 |
主分类号 |
H01L21/331 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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