发明名称 Semiconductor device and method of manufacture
摘要 In a semiconductor manufacturing method, an emitter region ( 211 ) and a base enhancement region ( 207 ) are formed to provide linear voltage, capacitance and low resistance characteristics. In the manufacturing method, a semiconductor device ( 200 ) is formed on a silicon substrate layer ( 101 ) with an epitaxial layer ( 203 ). Trenches ( 233 ) are cut into the epitaxial layer ( 203 ) and filled with oxide ( 601 ) to provide reduced junction capacitance and reduced base resistance. The emitter region ( 211 ) and the base enhancement region ( 207 ) are simultaneously formed through an anneal process.
申请公布号 US6900105(B2) 申请公布日期 2005.05.31
申请号 US20020211842 申请日期 2002.08.02
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 FREEMAN, JR. JOHN L.;BALDA RAYMOND J.;PRYOR ROBERT A.;PETRUCCI, JR. JOSEPH L.;JOHNSEN ROBERT J.
分类号 H01L21/331;H01L21/762;H01L29/08;H01L29/10;(IPC1-7):H01L21/331 主分类号 H01L21/331
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