Test wafer usage forecast modeling method

摘要

A method for modeling usage of semiconductor test wafers comprises the steps of: calculating an individual demand for test wafers by each of a plurality of tools, assigning respective ones of the plurality of tools to a plurality of levels based on ability of each tool to use wafers that have been processed by another one of the plurality of tools, assigning wafers made available by one of the plurality of tools to at least two other ones of the plurality of tools in proportion to the individual demands of each of the at least two other tools, and determining a total demand for test wafers, based on the number of wafers assigned to each of the plurality of tools in the lowest one of the plurality of levels.