发明名称 Availability, reliability or maintainability index including outage characterization
摘要 Improved reliability, availability and/or maintainability metrics have been developed that account for customer perceived factors such as frequency of outage, duration of outages, business impact of outages, etc. In various realizations and exploitations, such improved metrics may be utilized for managing and/or monitoring availability of enterprise information services or suites, availability of individual computers, devices or facilities, and/or availability of particular functionality or subsystems of any of the above. In one exploitation, personnel management decisions and/or compensation levels may be based on achieved values for such improved metrics. In other exploitations, contractual commitments and/or incentive fees related to an installed system or systems may be based on such improved metrics.
申请公布号 US6901347(B1) 申请公布日期 2005.05.31
申请号 US20000510938 申请日期 2000.02.22
申请人 SUN MICROSYSTEMS, INC. 发明人 MURRAY PAUL S.;LEARN KAREN
分类号 G06F11/00;(IPC1-7):G06F11/00 主分类号 G06F11/00
代理机构 代理人
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