发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor device wherein the interface state of wafer surface can be sufficiently recovered and be made small. SOLUTION: The method for manufacturing a semiconductor device includes a first step to make a hole 3 corresponding to the center of a respective chip formation part 2 on the rear side of a wafer 1, and a second step to apply hydrogen annealing. The bottom of the hole 3 is made close to the surface side of the wafer 1 forming a semiconductor device formation area, so that hydrogen enters the chip formation part 2 of the wafer 1 from its rear side. As a result, the interface state occuring in the semiconductor device formation area can be recovered and be made less. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2005136149(A) |
申请公布日期 |
2005.05.26 |
申请号 |
JP20030370255 |
申请日期 |
2003.10.30 |
申请人 |
NIPPON PRECISION CIRCUITS INC |
发明人 |
KUNIYOSHI KATSUYA;TAKAHASHI KATSUYUKI |
分类号 |
H01L21/324;(IPC1-7):H01L21/324 |
主分类号 |
H01L21/324 |
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