发明名称 |
INSULATED GATE-TYPE BIPOLAR TRANSISTOR AND MANUFACTURING METHOD THEREFOR |
摘要 |
PROBLEM TO BE SOLVED: To form a very thin collector layer with a comparatively simple method in an insulated gate-type bipolar transistor and the manufacturing method of the transistor. SOLUTION: A Ti barrier metal base film 110 and a TiN barrier metal film 111 are formed on surfaces of a p<SP>+</SP>-type base region 104 and an n<SP>+</SP>type emitter region 105. An emitter electrode film 112 is formed on them by Al-Si. A p<SP>-</SP>-type collector layer 109 is laminated and formed on the surface of an n<SP>+</SP>-type buffer layer 103. The p<SP>-</SP>-type collector layer 109 is very thinly formed on a surface layer of the n<SP>+</SP>-type buffer layer 103 by heating an Al film becoming a collector electrode film 113 at a temperature in a range of 600°C to 700°C. Diffusion of Al from the emitter electrode film 112 is inhibited by the Ti barrier metal base film 110 and the TiN barrier metal film 111. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2005135979(A) |
申请公布日期 |
2005.05.26 |
申请号 |
JP20030367448 |
申请日期 |
2003.10.28 |
申请人 |
SHINDENGEN ELECTRIC MFG CO LTD |
发明人 |
NAKAJIMA AKIRA;KURI SHINJI;KATAYAMA MASATOSHI;ISHIZUKA NOBUTAKA |
分类号 |
H01L21/28;H01L21/225;H01L29/739;H01L29/78;(IPC1-7):H01L29/78 |
主分类号 |
H01L21/28 |
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