发明名称 |
METHOD AND APPARATUS FOR RAPID SAMPLE PREPARATION IN A FOCUSED ION BEAM MICROSCOPE |
摘要 |
A coupon (100) for preparing a TEM sample holder (170) comprises a sheet of material (120) that includes a TEM sample holder form (170). There is at least one section of the sheet (120) connecting the TEM sample holder form (170) to other portions of the sheet (120). A TEM sample holder (170) is formed by cutting the TEM sample holder form (170) from the coupon in a press. The cutting joins the tip point (160) of a nano-manipulator probe tip (150) with the formed TEM sample holder (170). The tip point (160) of the probe (150) has a sample (140) attached for inspection in a TEM. |
申请公布号 |
WO2005046851(A2) |
申请公布日期 |
2005.05.26 |
申请号 |
WO2004US36560 |
申请日期 |
2004.11.03 |
申请人 |
OMNIPROBE, INC.;MOORE, THOMAS |
发明人 |
MOORE, THOMAS |
分类号 |
B01F;H01J37/20 |
主分类号 |
B01F |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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