发明名称 High density plasma apparatus and methods of operating the same
摘要 Disclosed is a high density plasma apparatus, which is capable of preventing breakage of an insulation film due to a potential difference by removing the potential difference in the course of transferring a wafer from a process chamber to a transfer chamber after completing a plasma process. The high density plasma apparatus may include a transfer chamber including a wafer transfer robot; a process chamber connected to the transfer chamber for plasma-processing a wafer being transferred by the wafer transfer robot; and an ultraviolet irradiator provided in the transfer chamber for irradiating an ultraviolet ray on the wafer plasma-processed in the process chamber and being transferred to the transfer chamber.
申请公布号 US2005109459(A1) 申请公布日期 2005.05.26
申请号 US20040960556 申请日期 2004.10.06
申请人 KWON YOUNG-MIN 发明人 KWON YOUNG-MIN
分类号 H01L21/3065;H01L21/00;(IPC1-7):C23F1/00;H01L21/306 主分类号 H01L21/3065
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