发明名称 Chemical mechanical polishing apparatus
摘要 Disclosed is a chemical mechanical polishing apparatus for polishing a surface of a wafer using a mechanical friction as well as a chemical polishing agent. The chemical mechanical polishing apparatus includes a polishing head for absorbing a wafer and a polishing means for polishing the wafer. The polishing apparatus may include a platen composed of at least three segments formed in conformity with polishing zones, a polishing pad provided on each of the segments, and a support for supporting the segments such that the segments are separately adjustable in the height depending on the polishing zones and are rotatable.
申请公布号 US2005113010(A1) 申请公布日期 2005.05.26
申请号 US20040997270 申请日期 2004.11.24
申请人 KIM HWAL P. 发明人 KIM HWAL P.
分类号 H01L21/304;B24B37/04;B24D7/14;B24D13/14;(IPC1-7):B24B5/00 主分类号 H01L21/304
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