发明名称 Semiconductor device and method of fabricating the same
摘要 A semiconductor wafer is thinned to a predetermined thickness by grinding the backside thereof (which is opposite to the side where a plurality of devices are formed and metal posts are further formed), and then a metal layer made of metal having a linear thermal expansion coefficient close to that of the semiconductor wafer is formed on the ground side. Further, the semiconductor wafer is sealed with resin, metal bumps are bonded to the tops of the metal posts (barrier metal layer), and then the semiconductor wafer is divided into the respective semiconductor devices. Silicon is used as material for the semiconductor wafer, and tungsten or molybdenum is used as metal constituting the metal layer.
申请公布号 US2005112800(A1) 申请公布日期 2005.05.26
申请号 US20040988508 申请日期 2004.11.16
申请人 SHINKO ELECTRIC INDUSTRIES CO., LTD. 发明人 YAMANO TAKAHARU
分类号 H01L23/12;H01L21/304;H01L21/60;H01L23/02;H01L23/31;H01L23/485;(IPC1-7):H01L21/44;H01L21/48;H01L21/50;H01L21/320;H01L21/476;H01L23/053 主分类号 H01L23/12
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