发明名称 Insulated gate bipolar transistor and method of fabricating the same
摘要 An insulated gate bipolar transistor has a P-type collector region containing a P-type impurity such as boron. A relatively thin N-type buffer region containing arsenic in a relatively high concentration is formed on the collector region via an anti-diffusion region. The anti-diffusion region is provided in such a way that its thickness is the same as or slightly smaller than the distance over which the P-type impurity is diffused from the collector region toward the buffer region in a device fabrication process.
申请公布号 US2005110076(A1) 申请公布日期 2005.05.26
申请号 US20040994064 申请日期 2004.11.19
申请人 SANKEN ELECTRIC CO., LTD. 发明人 TORII KATSUYUKI;TAKAHASHI RYOJI
分类号 H01L29/78;H01L21/331;H01L21/336;H01L29/08;H01L29/739;H01L31/109;(IPC1-7):H01L31/109 主分类号 H01L29/78
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