发明名称 Phase shift mask blank, phase shift mask, and pattern transfer method
摘要 In a phase shift mask blank comprising a phase shift multilayer film on a substrate, the phase shift multilayer film consists of at least one layer of light absorption function film and at least one layer of phase shift function film, and the light absorption function film has an extinction coefficient k which increases as the wavelength changes from 157 nm to 260 nm, and has a thickness of up to 15 nm. The phase shift mask blank has minimized wavelength dependency of transmittance and can be processed with a single dry etching gas.
申请公布号 US2005112477(A1) 申请公布日期 2005.05.26
申请号 US20040968886 申请日期 2004.10.21
申请人 TOPPAN PRINTING CO., LTD. 发明人 YOSHIKAWA HIROKI;INAZUKI YUKIO;OKAZAKI SATOSHI;HARAGUCHI TAKASHI;FUKUSHIMA YUICHI;II YOSHIHIRO;SAGA TADASHI
分类号 G03F1/08;G03F1/00;G03F1/32;G03F1/58;G03F1/68;H01L21/027;(IPC1-7):G21K5/00;G03C5/00;G03F9/00 主分类号 G03F1/08
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