Semiconductor device and testing circuit which can carries out a verifying test effectively for non-volatile memory cells

摘要

A testing circuit includes m block test units and a first logical processing unit. The block test unit compares a first data outputted from a test object with a reference data, and outputs a result as a test circuit output signal based on a output control signal. The first logical processing unit judges whether the all of m the test circuit output signals indicate that the first data is coincident with the reference data, and outputs a result as a total judgment result signal based on the m test circuit output signals. The block test unit includes a block judging unit and a block output selecting unit. The block judging unit compares the first data with the reference data to judge whether the first data is coincident with the reference data, and outputs a result as a block judgment result signal. The block output selecting unit outputs one of the block judgment result signal and a predetermined standard signal as the test circuit output signal based on the output control signal.