发明名称 METHOD FOR ACTIVATING IMPURITY, AND LASER IRRADIATION EQUIPMENT
摘要 PROBLEM TO BE SOLVED: To provide a method for activating impurities, by which the impurities existing at a deep position from the substrate surface of a semiconductor substrate, having the impurities added to its surface layer, is activated. SOLUTION: The method comprises a process of (a) irradiating the surface of the semiconductor substrate having the impurities added to its surface layer with a first pulse laser beam, and a process of (b) starting irradiating the surface of the semiconductor substrate with a second laser beam, during irradiation with the first laser beam in the process (a), or starting irradiating the surface of the semiconductor substrate with the second laser beam within 300 ns, from the time of finishing the irradiation with the first laser beam in the process (a). COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005136218(A) 申请公布日期 2005.05.26
申请号 JP20030371011 申请日期 2003.10.30
申请人 SUMITOMO HEAVY IND LTD 发明人 HAMADA SHIRO;YAMAGUCHI TOMOYUKI;HACHIWAKA SACHI
分类号 H01L21/265;H01L21/268;(IPC1-7):H01L21/265 主分类号 H01L21/265
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