发明名称 Sensor device for non-intrusive diagnosis of a semiconductor processing system
摘要 A sensor device, for diagnosing a processing system, generally includes a support platform and one or more sensors mounted on the support platform. The sensor senses a condition, such as direction or inclination or acceleration in one or two axes, of the sensor device and outputs a signal indicative thereof, which is then sent to a transmitter, also mounted to the support platform, for wireless transmission of the signal to a receiver mounted on or near the processing system. The support platform generally has physical characteristics, such as size, profile height, mass, flexibility and/or strength, substantially similar to those of the substrates that are to be processed in the processing system, so the sensor device can be transferred through the processing system in a manner similar to the manner in which production substrates are transferred through the processing system.
申请公布号 US6895831(B2) 申请公布日期 2005.05.24
申请号 US20030445598 申请日期 2003.05.27
申请人 APPLIED MATERIALS, INC. 发明人 HUNTER REGINALD
分类号 G01M99/00;G03F7/20;H01L21/00;H01L21/68;(IPC1-7):G01M19/00;G08C17/00;G01B11/00;H01L21/66 主分类号 G01M99/00
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